Circuit Cellar Issue 096 July 1998-PDF
ISSUE 96
July 1998
Theme: MEASUREMENT AND CONTROL
Task Manager—Professional Quirks, Janice Hughes, 2.
Reader I/O, 6.
New Product News, 8.
Unplanned Calibration Errors In Embedded Systems, by Mike Smith, 12.
A PIC-Based AC Power Meter, by Rick May, 22.
Designing For Smart Cards—Part 1: What’s a Smart Card All About?, by Carol Hovenga Fancher, 28.
Using A PC For Radiation Detection, Modifications for Multichannel Analyzer Capability, by Dan Cross-Cole, 58.
MicroSeries—FreeDOS and the Embedded Developer— Part 2: Using the Kernel, by Pat Villani, 66.
From The Bench—An Alarming Improvement—Part 2: Assembly Language Takes the Race, by Jeff Bachiochi, 74.
Silicon Update—The Micro Price is Right, by Tom Cantrell, 80.
Priority Interrupt—It’s All in How It’s Done, by Steve Ciarcia, 96.
EMBEDDED PC SECTION
Nouveau PC, edited by Harv Weiner, 36.
’x86 Processor Survey—Part 2: ’486-Class Embedded CPUs, by Pascal Dornier, 40.
Real-Time PC—Network Communication, by Ingo Cyliax, 45.
Applied PCs—A New View—Part 3: Sensors and Measurement Tools, by Fred Eady 52.
July 1998
Theme: MEASUREMENT AND CONTROL
Task Manager—Professional Quirks, Janice Hughes, 2.
Reader I/O, 6.
New Product News, 8.
Unplanned Calibration Errors In Embedded Systems, by Mike Smith, 12.
A PIC-Based AC Power Meter, by Rick May, 22.
Designing For Smart Cards—Part 1: What’s a Smart Card All About?, by Carol Hovenga Fancher, 28.
Using A PC For Radiation Detection, Modifications for Multichannel Analyzer Capability, by Dan Cross-Cole, 58.
MicroSeries—FreeDOS and the Embedded Developer— Part 2: Using the Kernel, by Pat Villani, 66.
From The Bench—An Alarming Improvement—Part 2: Assembly Language Takes the Race, by Jeff Bachiochi, 74.
Silicon Update—The Micro Price is Right, by Tom Cantrell, 80.
Priority Interrupt—It’s All in How It’s Done, by Steve Ciarcia, 96.
EMBEDDED PC SECTION
Nouveau PC, edited by Harv Weiner, 36.
’x86 Processor Survey—Part 2: ’486-Class Embedded CPUs, by Pascal Dornier, 40.
Real-Time PC—Network Communication, by Ingo Cyliax, 45.
Applied PCs—A New View—Part 3: Sensors and Measurement Tools, by Fred Eady 52.