Circuit Cellar Issue 277 August 2013-PDF
Issue #277
August 2013
Theme: Embedded Development
EDITOR'S LETTER—(Re)Discovering Embedded, by Mary Wilson, p. 6
NEW PRODUCTS, p. 10
MEMBER PROFILE, p. 17
CLIENT PROFILE, p. 18
TEST YOUR EQ, p. 19
Systematic Digital Processing (Part 2):
DSP-SQL Analysis Functions, by Mike Smith, Emily Marasco, and Maddie Lowe, p. 20
DIY Single-Board Computers (Part 2): Logic Design, by Oscar Vermeulen and Andrew Lynch, p. 30
QUESTIONS & ANSWERS—Raspberry Pi: One Year Later, 1 Million Sold: An Interview with Peter Lomas, by Clemens Valens, p. 38
Raspberry Pi I/O Board (Part 1): Introduction to an Inexpensive SBC, by Brian Millier p. 42
EMBEDDED IN THIN SLICES—Concurrency in Embedded Systems (Part 8): Using Files in Concurrent Linux Designs, by Bob Japenga, p. 48
THE CONSUMMATE ENGINEER—Testing and Testability (Part 4): Self Diagnostics, by George Novacek, p. 52
THE DARKER SIDE—Simulate and Design a Switched-Capacitor Filter, by Robert Lacoste, p. 56
FROM THE ARCHIVES— Advanced USB Design Debugging, by Colin O’Flynn, p. 64
FROM THE BENCH—Serial Displays Save Resources (Part 2): Button Commands, by Jeff Bachiochi, p. 70
CROSSWORD, p. 76
TECH THE FUTURE— The Future of VeryLarge-Scale Integration (VLSI) Technology, by Chris Kim, p. 80
August 2013
Theme: Embedded Development
EDITOR'S LETTER—(Re)Discovering Embedded, by Mary Wilson, p. 6
NEW PRODUCTS, p. 10
MEMBER PROFILE, p. 17
CLIENT PROFILE, p. 18
TEST YOUR EQ, p. 19
Systematic Digital Processing (Part 2):
DSP-SQL Analysis Functions, by Mike Smith, Emily Marasco, and Maddie Lowe, p. 20
DIY Single-Board Computers (Part 2): Logic Design, by Oscar Vermeulen and Andrew Lynch, p. 30
QUESTIONS & ANSWERS—Raspberry Pi: One Year Later, 1 Million Sold: An Interview with Peter Lomas, by Clemens Valens, p. 38
Raspberry Pi I/O Board (Part 1): Introduction to an Inexpensive SBC, by Brian Millier p. 42
EMBEDDED IN THIN SLICES—Concurrency in Embedded Systems (Part 8): Using Files in Concurrent Linux Designs, by Bob Japenga, p. 48
THE CONSUMMATE ENGINEER—Testing and Testability (Part 4): Self Diagnostics, by George Novacek, p. 52
THE DARKER SIDE—Simulate and Design a Switched-Capacitor Filter, by Robert Lacoste, p. 56
FROM THE ARCHIVES— Advanced USB Design Debugging, by Colin O’Flynn, p. 64
FROM THE BENCH—Serial Displays Save Resources (Part 2): Button Commands, by Jeff Bachiochi, p. 70
CROSSWORD, p. 76
TECH THE FUTURE— The Future of VeryLarge-Scale Integration (VLSI) Technology, by Chris Kim, p. 80